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China, Chinese IEC61032 IP1X IP2X IP3X IP4X Test Probe Kits1 Industrial Products Supplier Manufacturer Details, price list catalog:
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DetectorTest ProbeTest ProbeTest Probe Kits
Shenzhen Bonad Instrument Co., Ltd.
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Product Description IEC61032 IP1X IP2X IP3X IP4X test probe kits IP1X Test probe A Article NO.: BND-A Technical Parameters:1, Ball Diameter: 50mm2, Baffle Plate Diameter: 45mm3, Baffle Plate Thickness:4mm4, Handle Diameter: 10mm5, Handle Length :100mm6, According to IEC61032 figure 1 (the Test probe A), table 6 Application:1, Sphere can not touch the live parts or close to the dangerous parts.2, In the testing requirements of keep close to the dangerous part, the test steel ball without thrust need to be used with push tension meter, and steel body for protective coating need to apply to 50 + 5 n (30 + 3 n) forces IP2X Test probe B Article NO.: BND-B Technical Parameters:1, Knurled Finger Diameter:12mm2, Knurled Finger Length :80mm3, Baffle Plate Diameter :50mm4, Baffle Plate Length : 100mm5According to :IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950, IEC61032, IEC69745-1 IP3X test probe C Article NO.: BND-C Technical parameters :1, Test Probe Length :100mm2, Test Probe Diameter:2.5mm3, Dam- sphere Diameter:35mm4, Handle Diameter:10mm5, Handle Length 100mm6, According to IEC61032 figure 3 (the Test probe C), table 6 IP4X TEST PROBE D Article NO.: BND-D Technical parameters :1, Test Probe Length :100mm2, Test Probe Diameter:1.0mm3,Dam- sphere Diameter:35mm4,Handle Diameter:10mm5,Handle Length 100mm6, According to IEC61032 figure 4 (the Test probe D), table 6 GB/T4208-2008 (the first characteristic digital 4/5/6)
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