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China, Chinese Dw-Xrd-2700A Film Crystalline Analysis Material Structure Xrd Machine X Ray Diffractometer1 Industrial Products Supplier Manufacturer Details, price list catalog:

China Industrial Products Supplier Manufacturer List Catalog
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DetectorX Ray DetectorXrdX Ray Diffractometer

Chongqing Drawell Instrument Co., Ltd.

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Product Description DW-2700A XRD Technical SolutionThis XRD adopts the most advanced technology. The angle accuracy and precision of the goniometer has reached world advanced level. The light source and detector can work stably for a long time to ensure the accuracy and precision of diffraction peak position, peak shape and intensity measurement. 1.Applications & FunctionsIt can accurately measure metal and non-metal samples, do qualitative and quantitative analysis. When it is work with the corresponding accessories, it also can be used to analysis the influence of high temperature and low temperature on the material structure and analysis the structure of the film sample, metal material texture, stress measurement, etc. 2.Product Structure3.Our Advantages High stability X-ray source: the XRDadoptsAF3 model high frequency &high voltage X-ray generator, greatly improving the stability of the XRD measurement results;Long life X-ray tube: metal-ceramic X-ray tube has the characteristics of good heat dissipation, high running power (40kV ×40mA) and long service life;High precision goniometer: the diffraction angle drive adopts servo motor drive + optical coding control technology. Within the scope of the diffraction angle measurement, the diffraction angle is less than 0.02 ° linearity;X-ray protection is safe and reliable: when XRD is measuring sample,the protective doors are automatically locked to avoid radiation.Smart and convenient:The software automatic identification control technology, convenient for the use of the instrument operators.                                                                                                                                                                                                                                                                         4.Main Technical parameters4.1 High stability X-ray source Unit (AF3 model High Frequency &High Voltage X-ray generator)Rated power:3 kW    (HF,HV control technology)Tube voltage:10~60kV, 1kV/step;Tube current:5~50mA, 1mA/step;           Stability of tube voltage and tube current:≤0.005% ;There is Protection for over voltage, over current and over power and water depletion.X-ray tube:metal ceramic x-ray tube / Cu Target / Focus size: 1×10mm2/ 2.4kW .4.2 High Precision Goniometer UnitGoniometer:Adopt servo motor and optical coding technique to drive θs and θd; Scanning mode:θ-θ goniometer; it is vertical; the sample is put horizontally ;2θmeasuring range:-6°~160°; Radius of goniometer: 225mm;Scanning mode: continuous, stepping and Omg;Minimum step width Angle:0.0001?;                     Angle accuracy:≤0.001?;  Angle repeatability:≤0.0001? . It can cancel the idle running and do angle calibration automatically.        Angle locating speed:1500?/min;Diffraction Angle linearity: the Angle deviation of all peaks within the full spectrum shall not exceed ±0.02°.                                                           4.4Detector UnitClosed proportional DetectorSpectral resolution: <25% (Cu Kαspectral line);  Maximum linear count rate: >5×105cps                                                                                                                                                                   4.5Protection X -ray scattering ray protection device is safe and reliable with interlocking mechanism. When the sample is measured, the radiation-shielding door is automatically forbidden to open, which can protect the operator from the scattering ray radiation under any circumstances, and the scattering ray dose conforms to the international standard 1.0 sv/h.4.6 Control and processing softwareWindows 10 operating system;Qualitative and quantitative analysis of material phases , Kα1 ,α2 peeling, Full spectrum fitting, peak fitting, FWHM and grain size calculation, crystal cell measuring, second kind stress calculation, diffraction line indexation, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, quantitative analysis without standards, full spectral image fitting (WPF), XRD diffraction image simulation, etc.  5.DW 2700A XRD Configuration ListPartsConfigurationQtyRemarkX-ray high-voltage generator AF3 X ray high frequency high voltage generator X27.05 high voltage cable 100kVP 3310 pipe sleeve (including auto shutter)X25.07X-ray generator auto control system X25.0 2 stage Metal shell  AS2901/24Metal ceramic insulation X-ray tube 1High frequency &High voltage13 meters1 1includes 1 cable1lead and lead glass1Cu target, 2.4kWGoniometerSystemAG-3512H/DW-2700Agoniometer Slit and powder sample holder Through-hole sample plate Blind-hole sample plateFilterSlit Plate and Lighting System Adjustment Accessories1θ-θ structure11 for each5Aluminium matrix15Glass matrix1Match with the target material1 Recording andcontrolling systemClosed proportional detectorRecording and controlling unitMotor and communication cablePower supply unit1includes 1 connection cable1 12 motor cables, 1 communication cable1 Circulating water cooling systemDWC-3Circulating water cooling system  Circulating water connecting tube1Split structure2 PC system Intel i processor,RAM 4G, 128G Solid state disk, 19 inch LED, High Performance HD Display cardHP1108  A4 Laser printer1DELL1 System Control andApplicable Software DW Series Diffractometer Control Program SoftwarePhase qualitative and quantitative analysis software Data processing and application softwareDiffraction data card baseCrystal Structure Data Base1Windows  101 1 1 1 Technical documents DW series XRD user manual Data Process and Application Software User Manual DWC 3 Circulating Water Cooling System User Manual1 1 1 Accessary DW S 3 crystal graphite monochromator1Reflectivity > 28% Spare parts Fuses 1 , 1.5 , 2 , 2.5 , 3 , 3+ A Tools Agate Mortar ф100mm1010 for each1 1 

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